Henderson Characterization Lab (contains the following equipment): VASE Ellipsometer, M-2000 Ellipsometer, G-I line Exposure Tool, DUV Exposure Tool, FTIR, Four point Probe, TGA
Henderson Synthesis Lab (contains the following equipment): Contact Angle System, Multi-wavelength Dissolution Rate Monitor, Perkin-Elmer Dissolution Rate Monitor, PAL Laser, Quartz Crystal Microbalance with Dissapation Monitoring (QCM-D)
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